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[IEEE 2013 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) - Bangkok, Thailand (2013.12.10-2013.12.13)] 2013 IEEE International Conference on Industrial Engineering and Engineering Management - A new method for metrology monitor charts' spec limit setting

Ma, Jinyi Jenny, Cao, Yan Kaily, Chien, Weiting Kary
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Year:
2013
Language:
english
DOI:
10.1109/ieem.2013.6962594
File:
PDF, 1.38 MB
english, 2013
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