[IEEE 2015 IEEE International Conference on Information...

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[IEEE 2015 IEEE International Conference on Information Reuse and Integration (IRI) - San Francisco, CA, USA (2015.8.13-2015.8.15)] 2015 IEEE International Conference on Information Reuse and Integration - Formal Methods for Modelling and Analysis of Single-Event Upsets

Hansen, Rene Rydhof, Larsen, Kim Guldstrand, Olesen, Mads Chr., Wognsen, Erik Ramsgaard
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Year:
2015
Language:
english
DOI:
10.1109/iri.2015.54
File:
PDF, 907 KB
english, 2015
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