[IEEE 2015 IEEE International Conference on Information Reuse and Integration (IRI) - San Francisco, CA, USA (2015.8.13-2015.8.15)] 2015 IEEE International Conference on Information Reuse and Integration - Formal Methods for Modelling and Analysis of Single-Event Upsets
Hansen, Rene Rydhof, Larsen, Kim Guldstrand, Olesen, Mads Chr., Wognsen, Erik RamsgaardYear:
2015
Language:
english
DOI:
10.1109/iri.2015.54
File:
PDF, 907 KB
english, 2015