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[IEEE 2004 IEEE International Symposium on Circuits and Systems - Vancouver, BC, Canada (23-26 May 2004)] 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512) - RLC effects on worst-case switching pattern for on-chip buses
Shang-Wei Tu,, Jing-Yang Jou,, Yao-Wen Chang,Year:
2004
Language:
english
DOI:
10.1109/iscas.2004.1329429
File:
PDF, 255 KB
english, 2004