Combined Attenuation and High-Resolution Fault Measurements...

IEEE Photonics Journal 2015 / 12 Vol. 7; Iss. 6

Combined Attenuation and High-Resolution Fault Measurements Using Chaos-OTDR

Dong, Xiangyu, Wang, Anbang, Zhang, Jianguo, Han, Hong, Zhao, Tong, Liu, Xianglian, Wang, Yuncai
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Volume:
7
Language:
english
Journal:
IEEE Photonics Journal
DOI:
10.1109/jphot.2015.2501650
Date:
December, 2015
File:
PDF, 643 KB
english, 2015
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