![](/img/cover-not-exists.png)
[IEEE 1994 IEEE Nuclear Science Symposium - NSS'94 - Norfolk, VA, USA (30 Oct.-5 Nov. 1994)] Proceedings of 1994 IEEE Nuclear Science Symposium - NSS'94 - Elongated X-ray detectors for application in security inspection systems
Zagarij, L.B., Vinograd, E.L., Vidaj, Y.T.Volume:
2
Year:
1995
Language:
english
DOI:
10.1109/nssmic.1994.474481
File:
PDF, 308 KB
english, 1995