Time-Varying and Multiresolution Envelope Analysis and...

IEEE Transactions on Industrial Electronics 2015 / 12 Vol. 62; Iss. 12

Time-Varying and Multiresolution Envelope Analysis and Discriminative Feature Analysis for Bearing Fault Diagnosis

Kang, Myeongsu, Kim, Jaeyoung, Wills, Linda M, Kim, Jong-Myon
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Industrial Electronics
DOI:
10.1109/tie.2015.2460242
Date:
December, 2015
File:
PDF, 2.13 MB
english, 2015
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