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[IEEE Fifth World Congress on Intelligent Control and Automation - Hangzhou, China (15-19 June 2004)] Fifth World Congress on Intelligent Control and Automation (IEEE Cat. No.04EX788) - Study on MFL defect inspection and defect image process technology

Mao-An Wei,, Shijiu Jin,, Likun Wang,, Yingying Li,, Qian Cui,
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Year:
2004
Language:
english
DOI:
10.1109/wcica.2004.1342205
File:
PDF, 295 KB
english, 2004
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