![](/img/cover-not-exists.png)
[IEEE 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Moscow, Russia (2015.9.14-2015.9.18)] 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Multiple Cell Upset Cross-Section Uncertainty in Nanoscale Memories: Microdosimetric Approach
Zebrev, G. I., Zemtsov, K. S., Useinov, R. G., Gorbunov, M. S., Emeliyanov, V. V., Ozerov, A. I.Year:
2015
Language:
english
DOI:
10.1109/RADECS.2015.7365637
File:
PDF, 276 KB
english, 2015