![](/img/cover-not-exists.png)
[IEEE 2014 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Washington, DC, USA (2014.10.14-2014.10.16)] 2014 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Depth data assisted structure-from-motion parameter optimization and feature track correction
Recker, Shawn, Gribble, Christiaan, Shashkov, Mikhail M., Yepez, Mario, Hess-Flores, Mauricio, Joy, Kenneth I.Year:
2014
Language:
english
DOI:
10.1109/aipr.2014.7041930
File:
PDF, 1.04 MB
english, 2014