[IEEE 2014 IEEE Applied Imagery Pattern Recognition...

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[IEEE 2014 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Washington, DC, USA (2014.10.14-2014.10.16)] 2014 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Depth data assisted structure-from-motion parameter optimization and feature track correction

Recker, Shawn, Gribble, Christiaan, Shashkov, Mikhail M., Yepez, Mario, Hess-Flores, Mauricio, Joy, Kenneth I.
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Year:
2014
Language:
english
DOI:
10.1109/aipr.2014.7041930
File:
PDF, 1.04 MB
english, 2014
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