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[IEEE Proceedings of 39th Design Automation Conference - New Orleans, LA, USA (2002.6.10-2002.6.14)] Proceedings 2002 Design Automation Conference (IEEE Cat. No.02CH37324) - Effective diagnostics through interval unloads in a BIST environment
Wohl, P., Waicukauski, J.A., Patel, S., Maston, G.Year:
2002
Language:
english
DOI:
10.1109/dac.2002.1012630
File:
PDF, 653 KB
english, 2002