[IEEE 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Chengdu, China (2014.6.18-2014.6.20)] 2014 IEEE International Conference on Electron Devices and Solid-State Circuits - Device for measuring the flexural fracture strength of etched surface
Jun He,, Xian Huang,, Li Zhang,, Danqi Zhao,, Fang Yang,, Dacheng Zhang,Year:
2014
Language:
english
DOI:
10.1109/edssc.2014.7061190
File:
PDF, 841 KB
english, 2014