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[IEEE EM 2011) - Changchun, China (2011.09.3-2011.09.5)] 2011 IEEE 18th International Conference on Industrial Engineering and Engineering Management - The “hold up” effect of terminals on TD development
Xiao, Man-hun, Liu, Yu-jing, Sun, Rui-zi, Xie, Zhi-yongYear:
2011
Language:
english
DOI:
10.1109/icieem.2011.6035418
File:
PDF, 82 KB
english, 2011