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[IEEE 2015 IEEE International Vacuum Electronics Conference (IVEC) - Beijing, China (2015.4.27-2015.4.29)] 2015 IEEE International Vacuum Electronics Conference (IVEC) - Brightness of electron beam from a small carbon nanotube emitter fabricated using the probe contact method
Shin, Min-Sik, Choi, Young Chul, Kang, Jun-Tae, Jeon, Hyojin, Kim, Jae-Woo, Park, Sora, Choi, Sungyoul, Jeong, Jin-Woo, Yeon, Ji-Hwan, Ahn, Seungjoon, Song, Yoon-HoYear:
2015
Language:
english
DOI:
10.1109/ivec.2015.7223800
File:
PDF, 377 KB
english, 2015