An RFI Index to Quantify the Contamination of SMOS Data by...

IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing 2016 / 4 Vol. 9; Iss. 4

An RFI Index to Quantify the Contamination of SMOS Data by Radio-Frequency Interference

Soldo, Yan, Khazaal, Ali, Cabot, Francois, Kerr, Yann H.
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Volume:
9
Language:
english
Journal:
IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
DOI:
10.1109/jstars.2015.2425542
Date:
April, 2016
File:
PDF, 2.46 MB
english, 2016
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