[IEEE 2014 15th International Microprocessor Test and Verification Workshop (MTV) - Austin, TX, USA (2014.12.15-2014.12.16)] 2014 15th International Microprocessor Test and Verification Workshop - Mutation Based Feature Localization
Malburg, Jan, Encrenaz-Tiphene, Emmanuelle, Fey, GorschwinYear:
2014
Language:
english
DOI:
10.1109/mtv.2014.14
File:
PDF, 216 KB
english, 2014