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[IEEE 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - Forth Worth, TX, USA (June 6-11, 2004)] 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - Direct measurement of thermal circuit parameters using pulsed iv and the normalized difference unit
Baylis, C.P., Dunleavy, L.P., Daniel, J.E.Volume:
2
Year:
2004
Language:
english
DOI:
10.1109/mwsym.2004.1339211
File:
PDF, 262 KB
english, 2004