[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting...

[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Basis for the reliability analysis of the proton Linac for an ads program

Barni, D., Michelato, P., Monaco, L., Novati, M., Pagani, C., Paulon, R., Pierini, P., Sertore, D., Burgazzi, L.

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Volume:

Year:

2003

Language:

english

DOI:

10.1109/pac.2003.1288576

File:

PDF, 247 KB

english, 2003

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