[IEEE 2015 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) - Kuala Terengganu, Malaysia (2015.8.19-2015.8.21)] 2015 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) - Impact of stress-induced heating on PLR and WLR HCI testing
Seng, Ng Hong, Mei, Amy Voo MeiYear:
2015
Language:
english
DOI:
10.1109/rsm.2015.7355007
File:
PDF, 410 KB
english, 2015