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[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - Tackling test trade-offs from design, manufacturing to market using economic modeling
Volkerink, E.H., Khoche, A., Kamas, L.A., Rivoir, J., Kerkhoff, H.G.Year:
2001
Language:
english
DOI:
10.1109/test.2001.966736
File:
PDF, 1.20 MB
english, 2001