A Novel Diagnostic Technique for Open-Circuited Faults of...

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IEEE Transactions on Industrial Electronics 2016

A Novel Diagnostic Technique for Open-Circuited Faults of Inverters Based on Output Line-to-Line Voltage Model

Shu, Cheng, Ya-ting, Chen, Tian-jian, Yu, Xun, Wu
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Industrial Electronics
DOI:
10.1109/tie.2016.2535960
File:
PDF, 1.38 MB
english, 2016
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