Radiation Effects in CCD on CMOS Devices: First Analysis of...

IEEE Transactions on Nuclear Science 2015 / 12 Vol. 62; Iss. 6

Radiation Effects in CCD on CMOS Devices: First Analysis of TID and DDD Effects

Marcelot, O., Goiffon, V., Raine, M., Duhamel, O., Gaillardin, M., Molina, R., Magnan, P.
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2015.2497405
Date:
December, 2015
File:
PDF, 747 KB
english, 2015
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