[IEEE 2015 Joint International EUROSOI Workshop and...

[IEEE 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Bologna, Italy (2015.1.26-2015.1.28)] EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - A model for hot-carrier degradation in nLDMOS transistors based on the exact solution of the Boltzmann transport equation versus the drift-diffusion scheme

Sharma, Prateek, Tyaginov, Stanislav, Wimmer, Yannick, Rudolf, Florian, Enichlmair, Hubert, Park, Jong-Mun, Ceric, Hajdin, Grasser, Tibor

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Year:

2015

Language:

english

DOI:

10.1109/ulis.2015.7063763

File:

PDF, 574 KB

english, 2015

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