Numerical Investigation of Kink Effect Correlated with Defects in AlGaN/GaN High Electron Mobility Transistors
Charfeddine, M., Echouchene, F., Zaidi, M. A., Maaref, H.Volume:
10
Language:
english
Journal:
Journal of Computational and Theoretical Nanoscience
DOI:
10.1166/jctn.2013.2854
Date:
June, 2013
File:
PDF, 1.12 MB
english, 2013