Investigation of MBE grown inverted GaAs quantum dots

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Microelectronics Reliability 2016 / 2

Investigation of MBE grown inverted GaAs quantum dots

Nemcsics, Ákos, Pődör, Bálint, Tóth, Lajos, Balázs, János, Dobos, László, Makai, János, Csutorás, Márton, Ürmös, Antal
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.01.019
Date:
February, 2016
File:
PDF, 1.61 MB
english, 2016
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