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[IEEE 2009 International Conference on Artificial Intelligence and Computational Intelligence - Shanghai, China (2009.11.7-2009.11.8)] 2009 International Conference on Artificial Intelligence and Computational Intelligence - Application of Improved BP Network in the Flaws Evaluation of Conductive Materials

Qingjie, Yang, Yanfeng, Chen, Xinhua, Mao, Xiaohong, Kong
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Year:
2009
Language:
english
DOI:
10.1109/aici.2009.471
File:
PDF, 245 KB
english, 2009
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