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[IEEE 2015 IEEE 24th Asian Test Symposium (ATS) - Mumbai, India (2015.11.22-2015.11.25)] 2015 IEEE 24th Asian Test Symposium (ATS) - Integration of Hard Repair Techniques with ECC for Enhancing Fabrication Yield and Reliability of Embedded Memories
Lu, Shyue-Kung, Tsai, Cheng-Ju, Hashizume, MasakiYear:
2015
Language:
english
DOI:
10.1109/ats.2015.16
File:
PDF, 226 KB
english, 2015