[IEEE 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2015.9.27-2015.10.2)] 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Wear out effects in ESD characterization and testing
Smedes, Theo, Abessolo-Bidzo, DolphinYear:
2015
Language:
english
DOI:
10.1109/eosesd.2015.7314783
File:
PDF, 1.53 MB
english, 2015