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[IEEE IEEE 9th Topical Meeting on Electrical Performance of Electronic Packaging - Scottsdale, AZ, USA (23-25 Oct. 2000)] IEEE 9th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.00TH8524) - Micromachined picosecond optical near-field probe for pulse-coupling measurement of interconnection lines
Jongjoo Lee,, Heeseok Lee,, Seungyong Baek,, Yuchul Jung,, Joungho Kim,Year:
2000
Language:
english
DOI:
10.1109/epep.2000.895524
File:
PDF, 230 KB
english, 2000