[IEEE 1997 21st International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 Sept. 1997)] 1997 21st International Conference on Microelectronics. Proceedings - Simulation of electrical burnout of MOSFET structures
Vashchenko, V.A., Martynov, Y.B., Sinkevitch, V.F.Volume:
2
Year:
1997
Language:
english
DOI:
10.1109/icmel.1997.632870
File:
PDF, 374 KB
english, 1997