![](/img/cover-not-exists.png)
[IEEE Comput. Soc 15th International Conference on Pattern Recognition - Barcelona, Spain (3-7 Sept 2000)] Proceedings 15th International Conference on Pattern Recognition. ICPR-2000 - A theoretical justification of nearest feature line method
Zonglin Zhou,, Li, S.Z., Kap Luk Chan,Volume:
2
Year:
2000
Language:
english
DOI:
10.1109/icpr.2000.906185
File:
PDF, 372 KB
english, 2000