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[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - Circuit-level benchmarking of access devices for resistive nonvolatile memory arrays
Narayanan, P., Burr, G. W., Shenoy, R. S., Virwani, K., Kurdi, B.Year:
2014
Language:
english
DOI:
10.1109/iedm.2014.7047137
File:
PDF, 4.43 MB
english, 2014