[IEEE 2015 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2015.6.4-2015.6.5)] 2015 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Effects of internal electric field on efficiency of carrier multiplication solar cells
Hashimoto, Futo, Mori, NobuyaYear:
2015
Language:
english
DOI:
10.1109/imfedk.2015.7158573
File:
PDF, 134 KB
english, 2015