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[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Validation of circuit extraction procedure by means of frequency and time domain measurement
Antonini, G., Scogna, A.C., Orlandi, A., Ricchiuti, V., Selli, G., Luan, S., Drewniak, J.L.Volume:
1
Year:
2005
Language:
english
DOI:
10.1109/isemc.2005.1513469
File:
PDF, 408 KB
english, 2005