[IEEE 2015 20th Microoptics Conference (MOC) - Fukuoka,...

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[IEEE 2015 20th Microoptics Conference (MOC) - Fukuoka, Japan (2015.10.25-2015.10.28)] 2015 20th Microoptics Conference (MOC) - Characterization of ion implantation quantum well intermixing for carrier confinement of VCSEL

Moriwaki, Shouhei, Saitou, Minora, Kunisada, Shougo, Miyamoto, Tomoyuki
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Year:
2015
Language:
english
DOI:
10.1109/moc.2015.7416477
File:
PDF, 305 KB
english, 2015
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