[IEEE 2015 20th Microoptics Conference (MOC) - Fukuoka, Japan (2015.10.25-2015.10.28)] 2015 20th Microoptics Conference (MOC) - Characterization of ion implantation quantum well intermixing for carrier confinement of VCSEL
Moriwaki, Shouhei, Saitou, Minora, Kunisada, Shougo, Miyamoto, TomoyukiYear:
2015
Language:
english
DOI:
10.1109/moc.2015.7416477
File:
PDF, 305 KB
english, 2015