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[IEEE 2012 International Symposium on Instrumentation & Measurement, Sensor Network and Automation (IMSNA) - Sanya, China (2012.08.25-2012.08.28)] 2012 International Symposium on Instrumentation & Measurement, Sensor Network and Automation (IMSNA) - Kernel target alignment for feature kernel selection in universal steganographic detection based on multiple kernel SVM
Ke, Chao, Zhong, ShangpingYear:
2012
Language:
english
DOI:
10.1109/msna.2012.6324554
File:
PDF, 131 KB
english, 2012