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[IEEE 2015 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) - Sendai, Japan (2015.8.26-2015.8.28)] 2015 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) - Large-signal modeling of GaN devices with emphasis on trapping effect and thermal challenges (Invited)
Lin, Fujiang, Qian, Weiqiang, Li, Lei, Khan, MehdiYear:
2015
DOI:
10.1109/rfit.2015.7377941
File:
PDF, 780 KB
2015