[IEEE 2013 International Semiconductor Conference (CAS 2013) - Sinaia, Romania (2013.10.14-2013.10.16)] CAS 2013 (International Semiconductor Conference) - Effect of bismuth irradiation on crystalline silicon
Palade, Catalin, Slav, Adrian, Ciurea, Magdalena Lidia, Lazanu, SorinaYear:
2013
Language:
english
DOI:
10.1109/smicnd.2013.6688093
File:
PDF, 677 KB
english, 2013