Simulation Study of Node-State Transition Effect on the...

IEEE Transactions on Device and Materials Reliability 2015 / 9 Vol. 15; Iss. 3

Simulation Study of Node-State Transition Effect on the Single-Event Transient

Biwei, Liu, Yankang, Du, Zhao, Li, Lei, Li
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Volume:
15
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2015.2462129
Date:
September, 2015
File:
PDF, 1.20 MB
english, 2015
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