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[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Realizing high test quality goals with smart test resource usage
Xinli Gu,, Wang, C., Lee, A., Eklow, B., Kun-Han Tsai,, Tofte, J.A., Kassab, M., Rajski, J.Year:
2004
Language:
english
DOI:
10.1109/test.2004.1386989
File:
PDF, 664 KB
english, 2004