SPIE Proceedings [SPIE SPIE Optical Metrology 2013 -...

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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Three-axis optic-electronic autocollimation system for the inspection of large-scale objects

Konyakhin, Igor A., Lehmann, Peter H., Osten, Wolfgang, Timofeev, Alexandr N., Konyakhin, Aleksey, Albertazzi, Armando
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Volume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2020343
File:
PDF, 276 KB
english, 2013
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