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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Wavelets and Sparsity XV - Curvelet-based method for orientation estimation of particles
Van De Ville, Dimitri, Goyal, Vivek K., Papadakis, Manos, Sampo, Jouni, Takalo, Jouni J., Siltanen, Samuli, Lassas, Matti, Timonen, Jussi, Miettinen, ArttuVolume:
8858
Year:
2013
Language:
english
DOI:
10.1117/12.2025342
File:
PDF, 993 KB
english, 2013