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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, USA (Sunday 2 February 2014)] Measuring, Modeling, and Reproducing Material Appearance - Modeling cloth at micron resolution
Ortiz Segovia, Maria V., Urban, Philipp, Allebach, Jan P., Bala, KavitaVolume:
9018
Year:
2014
Language:
english
DOI:
10.1117/12.2038298
File:
PDF, 5.75 MB
english, 2014