SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, USA (Sunday 2 February 2014)] Image Processing: Machine Vision Applications VII - Improved wheal detection from skin prick test images
Niel, Kurt S., Bingham, Philip R., Bulan, OrhanVolume:
9024
Year:
2014
Language:
english
DOI:
10.1117/12.2038442
File:
PDF, 762 KB
english, 2014