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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, USA (Sunday 2 February 2014)] Image Processing: Machine Vision Applications VII - Image thresholding using standard deviation
Niel, Kurt S., Bingham, Philip R., Sung, Jung-Min, Kim, Dae-Chul, Choi, Bong-Yeol, Ha, Yeong-HoVolume:
9024
Year:
2014
Language:
english
DOI:
10.1117/12.2040990
File:
PDF, 611 KB
english, 2014