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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, USA (Sunday 2 February 2014)] Measuring, Modeling, and Reproducing Material Appearance - Estimating neugebauer primaries for multi-channel spectral printing modeling

Ortiz Segovia, Maria V., Urban, Philipp, Allebach, Jan P., Slavuj, Radovan, Coppel, Ludovic G., Olen, Melissa, Hardeberg, Jon Yngve
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Volume:
9018
Year:
2014
Language:
english
DOI:
10.1117/12.2044041
File:
PDF, 321 KB
english, 2014
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