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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Interferometry XVII: Advanced Applications - Artifact-free calibration of spatial carrier interferometry
Furlong, Cosme, Gorecki, Christophe, de Groot, Peter J., Novak, Erik L., Kimbrough, Brad, Prause, Korbinian, Novak, ErikVolume:
9204
Year:
2014
Language:
english
DOI:
10.1117/12.2060559
File:
PDF, 7.59 MB
english, 2014