SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Developments in X-Ray Tomography IX - Integrated control system environment for high-throughput tomography
Stock, Stuart R., Khokhriakov, Igor, Lottermoser, Lars, Gehrke, Rainer, Kracht, Thorsten, Wintersberger, Eugen, Kopmann, Andreas, Vogelgesang, Matthias, Beckmann, FelixVolume:
9212
Year:
2014
Language:
english
DOI:
10.1117/12.2060975
File:
PDF, 2.79 MB
english, 2014