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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, United States (Sunday 8 February 2015)] Image Processing: Machine Vision Applications VIII - Fast face recognition by using an inverted index

Lam, Edmund Y., Niel, Kurt S., Herrmann, Christian, Beyerer, Jürgen
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Volume:
9405
Year:
2015
Language:
english
DOI:
10.1117/12.2078988
File:
PDF, 960 KB
english, 2015
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