SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Method of increasing the working distance of optical-electronic autocollimator

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Konyakhin, Igor A., Moiseeva, Anastasia A.
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Volume:
9525
Year:
2015
Language:
english
DOI:
10.1117/12.2184128
File:
PDF, 544 KB
english, 2015
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