SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Automated Visual Inspection and Machine Vision - New opportunities of pegmatites enrichment by optical sorting

Beyerer, Jürgen, Puente León, Fernando, Chertov, Aleksandr N., Gorbunova, Elena V., Alekhin, Artem A., Korotaev, Valery V., Skamnitskaya, Lyubov S., Bubnova, Tatiana P.
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Volume:
9530
Year:
2015
Language:
english
DOI:
10.1117/12.2184248
File:
PDF, 2.40 MB
english, 2015
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